Publicacións (13) Publicacións nas que participase algún/ha investigador/a

1993

  1. A simple and highly parallelizable method for real-time dynamic simulation based on velocity transformations

    Computer Methods in Applied Mechanics and Engineering, Vol. 107, Núm. 3, pp. 313-339

  2. An optimized preparation process of stainless-steel substrates and their application to thin-film high pressure sensors

    Sensors and Actuators: A. Physical, Vol. 37-38, Núm. C, pp. 703-707

  3. Dislocation Loops in a‐Silicon Nitride

    Journal of the American Ceramic Society, Vol. 76, Núm. 8, pp. 2136-2138

  4. Dynamics of B sublimation from boron doped graphite USB15

    Nuclear Inst. and Methods in Physics Research, B, Vol. 80-81, Núm. PART 2, pp. 1468-1471

  5. Edge physics and H-mode studies in ASDEX Upgrade

    Plasma Physics and Controlled Fusion, Vol. 35, Núm. SB

  6. Evaluation of sensitivity and observability of the state vector for system identification and experimental design

    Water Science and Technology

  7. How a stable crack extension changes the Weibull modulus of cleavage fracture probability

    International Journal of Fracture, Vol. 62, Núm. 2

  8. Influence of Oxygen Partial Pressure on the Quasi‐Ternary System Cr─Mn─Ti Oxide

    Journal of the American Ceramic Society, Vol. 76, Núm. 11, pp. 2869-2878

  9. Mechanical and electrical properties Of SiO2 thin films r.f. sputtered on non-silicon substrates for mechanical sensors

    Sensors and Actuators: A. Physical, Vol. 37-38, Núm. C, pp. 57-60

  10. Physical analysis of electromigration damage under non-d.c. conditions

    Microelectronics Reliability, Vol. 33, Núm. 8, pp. 1189-1198

  11. Singular character of axisymmetric stresses around wedge-shaped notches in cylindrical bodies under torsion: unit step load

    Theoretical and Applied Fracture Mechanics, Vol. 18, Núm. 3, pp. 247-257

  12. Strain sensitivity and temperature influence on sputtered thin films for piezoresistive sensors

    Sensors and Actuators: A. Physical, Vol. 37-38, Núm. C, pp. 784-789

  13. Threshold energy for sputtering and its dependence on angle of incidence

    Nuclear Inst. and Methods in Physics Research, B, Vol. 83, Núm. 1-2, pp. 95-109