Structural characterization of highly strained InAs N monolayer lasers and quantum well structures by X-ray diffraction and transmission electron microscopy
- Mazuelas, A.
- Molina, S.I.
- Aragón, G.
- Meléndez, J.
- Dotor, M.L.
- Huertas, P.
- Briones, F.
ISSN: 0022-0248
Datum der Publikation: 1993
Ausgabe: 127
Nummer: 1-4
Seiten: 596-600
Art: Artikel