Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

1. Danilewsky, A.N.
2. Wittge, J.
3. Croell, A.
4. Allen, D.
5. McNally, P.
6. Vagovič, P.
7. Dos Santos Rolo, T.
8. Li, Z.
9. Baumbach, T.
10. Gorostegui-Colinas, E.
11. Garagorri, J.
12. Elizalde, M.R.
13. Fossati, M.C.
14. Bowen, D.K.
15. Tanner, B.K.