Are Analytical Techniques Worthwhile for Analog IC Placement?
- Lin, Y.
- Li, Y.
- Fang, D.
- Madhusudan, M.
- Sapatnekar, S.S.
- Harjani, R.
- Hu, J.
Konferenzberichte:
Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
ISBN: 9783981926361
Datum der Publikation: 2022
Seiten: 154-159
Art: Konferenz-Beitrag