A Circuit Attention Network-Based Actor-Critic Learning Approach to Robust Analog Transistor Sizing
- Li, Y.
- Lin, Y.
- Madhusudan, M.
- Sharma, A.
- Sapatnekar, S.
- Harjani, R.
- Hu, J.
Konferenzberichte:
2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD, MLCAD 2021
ISBN: 9781665431668
Datum der Publikation: 2021
Art: Konferenz-Beitrag