Analytical Modeling of Transient Electromigration Stress based on Boundary Reflections

  1. Al Shohel, M.A.
  2. Chhabria, V.A.
  3. Evmorfopoulos, N.
  4. Sapatnekar, S.S.
Actes:
IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

ISSN: 1092-3152

ISBN: 9781665445078

Any de publicació: 2021

Volum: 2021-November

Tipus: Aportació congrés

DOI: 10.1109/ICCAD51958.2021.9643570 GOOGLE SCHOLAR
Font de les dades: Scopus