Analyzing the Effects of Interconnect Parasitics in the STT CRAM In-Memory Computational Platform

  1. Zabihi, M.
  2. Sharma, A.K.
  3. Mankalale, M.G.
  4. Chowdhury, Z.I.
  5. Zhao, Z.
  6. Resch, S.
  7. Karpuzcu, U.R.
  8. Wang, J.-P.
  9. Sapatnekar, S.S.
Zeitschrift:
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits

ISSN: 2329-9231

Datum der Publikation: 2020

Ausgabe: 6

Nummer: 1

Seiten: 71-79

Art: Artikel

DOI: 10.1109/JXCDC.2020.2985314 GOOGLE SCHOLAR lock_openOpen Access editor
Datenquelle: Scopus