A Fast and Retargetable Framework for Logic-IP-Internal Electromigration Assessment Comprehending Advanced Waveform Effects

  1. Jain, P.
  2. Cortadella, J.
  3. Sapatnekar, S.S.
Revista:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

Ano de publicación: 2016

Volume: 24

Número: 6

Páxinas: 2345-2358

Tipo: Artigo

DOI: 10.1109/TVLSI.2015.2505504 GOOGLE SCHOLAR
Fonte de datos: Scopus