A retargetable and accurate methodology for logic-IP-internal electromigration assessment
- Jain, P.
- Sapatnekar, S.S.
- Cortadella, J.
Proceedings:
20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015
ISBN: 9781479977925
Year of publication: 2015
Pages: 346-351
Type: Conference paper