What happens when circuits grow old: Aging issues in CMOS design

  1. Sapatnekar, S.S.
Proceedings:
2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013

ISBN: 9781467344357

Year of publication: 2013

Type: Conference paper

DOI: 10.1109/VLDI-DAT.2013.6533827 GOOGLE SCHOLAR
Data source: Scopus