Circuit reliability: From physics to architectures: Embedded tutorial paper

  1. Fang, J.
  2. Gupta, S.
  3. Kumar, S.V.
  4. Marella, S.K.
  5. Mishra, V.
  6. Zhou, P.
  7. Sapatnekar, S.S.
Actes de conférence:
IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

ISSN: 1092-3152

Année de publication: 2012

Pages: 243-246

Type: Communication dans un congrès