Sign in
Groups
Researchers
Funding
Results
Overcoming variations in nanometer-scale technologies
Sapatnekar, S.S.
Journal
:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
ISSN
:
2156-3357
Year of publication
:
2011
Volume
:
1
Issue
:
1
Pages
:
5-18
Type
:
Article
Export
Export
×
MLA
modern-language-association
APA
apa
Chicago
chicago-fullnote-bibliography
Harvard
harvard-cite-them-right
Vancouver
vancouver-author-date
RIS
BibTex
Export
×
This document cannot be exported because it belongs to another portal.
DOI:
10.1109/JETCAS.2011.2138250
GOOGLE SCHOLAR
Data source: Scopus
Contact
Legal notice
Help
translate
en
arrow_drop_down
translate
en
arrow_drop_down
es
ca
eu
gl
fr
de