Tritium depth profiling in carbon samples from fusion experiments
- Friedrich, M.
- Pilz, W.
- Sun, G.
- Behrisch, R.
- García-Rosales, C.
- Bekris, N.
- Penzhorn, R.-D.
ISSN: 0168-583X
Année de publication: 2000
Volumen: 172
Número: 1-4
Pages: 655-658
Type: Article