Determination of residual stresses in cathodic arc coatings by means of the parallel beam glancing X-ray diffraction technique

  1. Moreno, C.M.
  2. Sanchez, J.M.
  3. Ardila, L.C.
  4. Molina Aldareguia, J.M.
Aldizkaria:
Thin Solid Films

ISSN: 0040-6090

Argitalpen urtea: 2009

Alea: 518

Zenbakia: 1

Orrialdeak: 206-212

Mota: Artikulua

DOI: 10.1016/J.TSF.2009.07.011 GOOGLE SCHOLAR
Datuen iturria: Scopus