Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology
- Madhusudan, M.
- Poojary, J.
- Sharma, A.K.
- Ramprasath, S.
- Kunal, K.
- Sapatnekar, S.S.
- Harjani, R.
ISSN: 1930-8876
ISBN: 9798350304237
Year of publication: 2023
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference
Volume: 2023-September
Pages: 69-72
Type: Conference paper