Physical analysis of electromigration damage under bidirectional (BC) and Pulsed DC (PDC) conditions
- Castaño, E.
- Manuel De Lardizabal, P.
- Maiz, J.
ISBN: 9780879426736
Datum der Publikation: 1991
1991 Proceedings 8th International IEEE VLSI Multilevel Interconnection Conference, VMIC 1991
Seiten: 258-264
Art: Konferenz-Beitrag