Sealable Methods for the Analysis and Optimization of Gate Oxide Breakdown
- Fang, Jianxin
- Sapatnekar, Sachin S.
ISSN: 1948-3287
ISBN: 978-1-4244-6455-5
Datum der Publikation: 2010
Seiten: 638-645
Kongress: 11th International Symposium on Quality Electronic Design (ISQED)
Art: Konferenz-Beitrag