From nanometric Ni/Al multilayers to intermetallic thin films
- Jeira, M. T.
- Noro, J.
- Ramos, A. S.
- Kim, YW (coord.)
- Morris, D (coord.)
- Yang, R (coord.)
- Leyens, C (coord.)
ISBN: 978-0-87339-720-9
Datum der Publikation: 2008
Seiten: 391-398
Kongress: Structural Aluminides for Elevated Temperatures Symposium held at the TMS 2008 Annual Meeting and Exhibition
Art: Konferenz-Beitrag