Enrique
Castaño Carmona
Investigador Principal
![Foto de Enrique](/img/uploaded/8F798CF7C278700ED5A23F0F12F16BDD.jpg)
![Foto de Intel Corporation, Systems Research Center, Systems Technology Lab.](/img/noimage_org.png)
Intel Corporation, Systems Research Center, Systems Technology Lab.
San Jose, EE. UU.Publicaciones en colaboración con investigadores/as de Intel Corporation, Systems Research Center, Systems Technology Lab. (3)
1993
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Physical analysis of electromigration damage under non-d.c. conditions
Microelectronics Reliability, Vol. 33, Núm. 8, pp. 1189-1198
1991
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In situ observations of dc and ac electromigration in passivated Al lines
Applied Physics Letters, Vol. 59, Núm. 1, pp. 129-131
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Physical analysis of electromigration damage under bidirectional (BC) and Pulsed DC (PDC) conditions
1991 Proceedings 8th International IEEE VLSI Multilevel Interconnection Conference, VMIC 1991