Aportaciones congreso (15) Publicaciones en las que ha participado algún/a investigador/a

2015

  1. A Retargetable and Accurate Methodology for Logic-IP-internal Electromigration Assessment

    2015 20TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC)

  2. A retargetable and accurate methodology for logic-IP-internal electromigration assessment

    20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015

  3. Circuit Delay Variability Due to Wire Resistance Evolution Under AC Electromigration

    2015 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)

  4. Circuit delay variability due to wire resistance evolution under AC electromigration

    IEEE International Reliability Physics Symposium Proceedings

  5. Comparison study of micro-algorithms for lighting comfort

    AIP Conference Proceedings

  6. FEMTO: Fast error analysis in Multipliers through Topological Traversal

    2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015

  7. Impact on performance, power, area and wirelength using electromigration-aware cells

    Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

  8. Joint precision optimization and high level synthesis for approximate computing

    Proceedings - Design Automation Conference

  9. Optimization of FinFET-based circuits using a dual gate pitch technique

    2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015

  10. Reactive Clocks with Variability-Tracking Jitter

    2015 33RD IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD)

  11. Reactive clocks with variability-Tracking jitter

    Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015

  12. Reducing the signal Electromigration effects on different logic gates by cell layout optimization

    2015 IEEE 6th Latin American Symposium on Circuits and Systems, LASCAS 2015 - Conference Proceedings

  13. Stochastic and Topologically Aware Electromigration Analysis for Clock Skew

    2015 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)

  14. Stochastic and topologically aware electromigration analysis for clock skew

    IEEE International Reliability Physics Symposium Proceedings

  15. WHEN LESS IS MORE: A COMPARATIVE STUDY ON ADVERTISING AVOIDANCE

    CULTURAL PERSPECTIVES IN A GLOBAL MARKETPLACE