Departamento académico
(FCEE) Empresa
Aportaciones congreso (15) Publicaciones en las que ha participado algún/a investigador/a
2015
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A Retargetable and Accurate Methodology for Logic-IP-internal Electromigration Assessment
2015 20TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC)
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A retargetable and accurate methodology for logic-IP-internal electromigration assessment
20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015
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Circuit Delay Variability Due to Wire Resistance Evolution Under AC Electromigration
2015 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
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Circuit delay variability due to wire resistance evolution under AC electromigration
IEEE International Reliability Physics Symposium Proceedings
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Comparison study of micro-algorithms for lighting comfort
AIP Conference Proceedings
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FEMTO: Fast error analysis in Multipliers through Topological Traversal
2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015
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Impact on performance, power, area and wirelength using electromigration-aware cells
Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
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Joint precision optimization and high level synthesis for approximate computing
Proceedings - Design Automation Conference
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Optimization of FinFET-based circuits using a dual gate pitch technique
2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015
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Reactive Clocks with Variability-Tracking Jitter
2015 33RD IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD)
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Reactive clocks with variability-Tracking jitter
Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015
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Reducing the signal Electromigration effects on different logic gates by cell layout optimization
2015 IEEE 6th Latin American Symposium on Circuits and Systems, LASCAS 2015 - Conference Proceedings
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Stochastic and Topologically Aware Electromigration Analysis for Clock Skew
2015 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
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Stochastic and topologically aware electromigration analysis for clock skew
IEEE International Reliability Physics Symposium Proceedings
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WHEN LESS IS MORE: A COMPARATIVE STUDY ON ADVERTISING AVOIDANCE
CULTURAL PERSPECTIVES IN A GLOBAL MARKETPLACE