Atomistic simulation of tensile strength and toughness of cracked Cu nanowires
- Luque, A.
- Aldazabal, J.
- Martínez-Esnaola, J.M.
- Sevillano, J.G.
ISSN: 8756-758X, 1460-2695
Année de publication: 2006
Volumen: 29
Número: 8
Pages: 615-622
Type: Article