A new methodology for the on-wafer characterization of RF integrated transformers

  1. Cendoya, I.
  2. De Nó, J.
  3. Sedano, B.
  4. García-Alonso, A.
  5. Valderas, D.
  6. Gutiérrez, I.
Aldizkaria:
IEEE Transactions on Microwave Theory and Techniques

ISSN: 0018-9480

Argitalpen urtea: 2007

Alea: 55

Zenbakia: 5

Orrialdeak: 1046-1053

Mota: Artikulua

DOI: 10.1109/TMTT.2007.895648 GOOGLE SCHOLAR
Datuen iturria: Scopus