Characterization of interconnect interfacial adhesion by cross-sectional nanoindentation
- Scherban, T.
- Pantuso, D.
- Sun, B.
- El-Mansy, S.
- Xu, J.
- Elizalde, M.R.
- Sánchez, J.M.
- Martínez-Esnaola, J.M.
ISSN: 0376-9429
Year of publication: 2003
Volume: 120
Issue: 1-2
Pages: 421-429
Type: Article