A system for automatic artifact removal in ictal scalp EEG based on independent component analysis and Bayesian classification
- LeVan, P.
- Urrestarazu, E.
- Gotman, J.
ISSN: 1388-2457
Ano de publicación: 2006
Volume: 117
Número: 4
Páxinas: 912-927
Tipo: Artigo