Impact of Self-heating on Performance and Reliability in FinFET and GAAFET Designs
- Chhabria, V.A.
- Sapatnekar, S.S.
ISSN: 1948-3295, 1948-3287
ISBN: 9781728103921
Ano de publicación: 2019
Volume: 2019-March
Páxinas: 235-240
Tipo: Achega congreso
Actas:
Proceedings - International Symposium on Quality Electronic Design, ISQED
