Cell-Internal Electromigration: Analysis and Pin Placement Based Optimization

  1. Posser, G.
  2. Mishra, V.
  3. Jain, P.
  4. Reis, R.
  5. Sapatnekar, S.S.
Revue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Année de publication: 2016

Volumen: 35

Número: 2

Pages: 220-231

Type: Article

DOI: 10.1109/TCAD.2015.2456427 GOOGLE SCHOLAR
La source de données: Scopus