Stochastic and topologically aware electromigration analysis for clock skew

  1. Jain, P.
  2. Sapatnekar, S.S.
  3. Cortadella, J.
Aktak:
IEEE International Reliability Physics Symposium Proceedings

ISSN: 1541-7026

ISBN: 9781467373623

Argitalpen urtea: 2015

Alea: 2015-May

Orrialdeak: 3D41-3D46

Mota: Biltzar ekarpena

DOI: 10.1109/IRPS.2015.7112714 GOOGLE SCHOLAR
Datuen iturria: Scopus