Stochastic and topologically aware electromigration analysis for clock skew

  1. Jain, P.
  2. Sapatnekar, S.S.
  3. Cortadella, J.
Actas:
IEEE International Reliability Physics Symposium Proceedings

ISSN: 1541-7026

ISBN: 9781467373623

Ano de publicación: 2015

Volume: 2015-May

Páxinas: 3D41-3D46

Tipo: Achega congreso

DOI: 10.1109/IRPS.2015.7112714 GOOGLE SCHOLAR
Fonte de datos: Scopus