Improving STT-MRAM density through multibit error correction

  1. Del Bel, B.
  2. Kim, J.
  3. Kim, C.H.
  4. Sapatnekar, S.S.
Aktak:
Proceedings -Design, Automation and Test in Europe, DATE

ISSN: 1530-1591

ISBN: 9783981537024

Argitalpen urtea: 2014

Mota: Biltzar ekarpena

DOI: 10.7873/DATE2014.195 GOOGLE SCHOLAR