A novel semi-analytical approach for fast electromigration stress analysis in multi-segment interconnects
- Axelou, O.
- Evmorfopoulos, N.
- Floros, G.
- Stamoulis, G.
- Sapatnekar, S.S.
Actas:
IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN: 1092-3152
ISBN: 9781450392174
Ano de publicación: 2022
Tipo: Achega congreso