Analysis of Pattern-dependent Rapid Thermal Annealing Effects on SRAM Design

  1. Chhabria, V.A.
  2. Sapatnekar, S.S.
Actes de conférence:
Proceedings - International Symposium on Quality Electronic Design, ISQED

ISSN: 1948-3295 1948-3287

ISBN: 9798350334753

Année de publication: 2023

Volumen: 2023-April

Type: Communication dans un congrès

DOI: 10.1109/ISQED57927.2023.10129399 GOOGLE SCHOLAR