Stress-Aware Performance Evaluation of 3D-Stacked Wide I/O DRAMs

  1. Li, Tengtao
  2. Sapatnekar, Sachin S.
Book Series:
2017 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)

ISSN: 1933-7760

ISBN: 978-1-5386-3093-8

Year of publication: 2017

Pages: 645-650

Congress: IEEE/ACM 36th International Conference on Computer-Aided Design (ICCAD)

Type: Conference paper

GOOGLE SCHOLAR
Data source: WoS