A holistic analysis of circuit timing variations in 3D-ICs with thermal and TSV-induced stress considerations
- Marella, Sravan K.
- Kumar, Sanjay V.
- Sapatnekar, Sachin S.
ISSN: 1933-7760
ISBN: 978-1-4503-1573-9
Ano de publicación: 2012
Páxinas: 317-324
Congreso: IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
Tipo: Achega congreso