Ibon
Ocaña Arizcorreta
Investigador Principal
J.A.
Maiz
Publicaciones en las que colabora con J.A. Maiz (6)
2007
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Adhesion studies in integrated circuit interconnect structures
Engineering Failure Analysis, Vol. 14, Núm. 2, pp. 349-354
2006
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Adhesion studies in low-k interconnects using cross sectional nanoindentation
AIP Conference Proceedings
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Fracture characterization in patterned thin films by cross-sectional nanoindentation
Acta Materialia, Vol. 54, Núm. 13, pp. 3453-3462
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Simulation of cross-sectional nanoindentation in interconnect structures with cohesive elements
Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture
2005
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A new technique for the characterization of the adhesion in integrated circuit interconnect structures
11th International Conference on Fracture 2005, ICF11
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A new technique for the characterization of the adhesion in integrated circuit interconnect structures
Materials Research Society Symposium Proceedings