Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach
- Rigamonti, M.
- Baraldi, P.
- Zio, E.
- Alessi, A.
- Astigarraga, D.
- Galarza, A.
Zeitschrift:
Microelectronics Reliability
ISSN: 0026-2714
Datum der Publikation: 2016
Ausgabe: 60
Seiten: 48-61
Art: Artikel