Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach

  1. Rigamonti, M.
  2. Baraldi, P.
  3. Zio, E.
  4. Alessi, A.
  5. Astigarraga, D.
  6. Galarza, A.
Aldizkaria:
Microelectronics Reliability

ISSN: 0026-2714

Argitalpen urtea: 2016

Alea: 60

Orrialdeak: 48-61

Mota: Artikulua

DOI: 10.1016/J.MICROREL.2016.02.015 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus