Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon
- Tanner, B.K.
- Allen, D.
- Wittge, J.
- Danilewsky, A.N.
- Garagorri, J.
- Gorostegui-Colinas, E.
- Elizalde, M.R.
- McNally, P.J.
Aldizkaria:
Crystals
ISSN: 2073-4352
Argitalpen urtea: 2017
Alea: 7
Zenbakia: 11
Mota: Artikulua
