Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon

  1. Tanner, B.K.
  2. Allen, D.
  3. Wittge, J.
  4. Danilewsky, A.N.
  5. Garagorri, J.
  6. Gorostegui-Colinas, E.
  7. Elizalde, M.R.
  8. McNally, P.J.
Revista:
Crystals

ISSN: 2073-4352

Ano de publicación: 2017

Volume: 7

Número: 11

Tipo: Artigo

DOI: 10.3390/CRYST7110347 GOOGLE SCHOLAR lock_openAcceso aberto editor