Incorporating hot-carrier injection effects into timing analysis for large circuits

  1. Fang, J.
  2. Sapatnekar, S.S.
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

Year of publication: 2014

Volume: 22

Issue: 12

Pages: 2738-2751

Type: Article

DOI: 10.1109/TVLSI.2013.2296499 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus