Incorporating hot-carrier injection effects into timing analysis for large circuits

  1. Fang, J.
  2. Sapatnekar, S.S.
Revue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

Année de publication: 2014

Volumen: 22

Número: 12

Pages: 2738-2751

Type: Article

DOI: 10.1109/TVLSI.2013.2296499 GOOGLE SCHOLAR

Objectifs de Développement Durable