Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability
- Fang, J.
- Sapatnekar, S.S.
Konferenzberichte:
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
ISBN: 9781424475155
Datum der Publikation: 2011
Seiten: 689-694
Art: Konferenz-Beitrag