Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability
- Fang, J.
- Sapatnekar, S.S.
Aktak:
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
ISBN: 9781424475155
Argitalpen urtea: 2011
Orrialdeak: 689-694
Mota: Biltzar ekarpena