A framework for scalable postsilicon statistical delay prediction under process variations

  1. Liu, Q.
  2. Sapatnekar, S.S.
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Year of publication: 2009

Volume: 28

Issue: 8

Pages: 1201-1212

Type: Article

DOI: 10.1109/TCAD.2009.2021732 GOOGLE SCHOLAR
Data source: Scopus