A framework for scalable postsilicon statistical delay prediction under process variations

  1. Liu, Q.
  2. Sapatnekar, S.S.
Aldizkaria:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSN: 0278-0070

Argitalpen urtea: 2009

Alea: 28

Zenbakia: 8

Orrialdeak: 1201-1212

Mota: Artikulua

DOI: 10.1109/TCAD.2009.2021732 GOOGLE SCHOLAR
Datuen iturria: Scopus