Width-dependent statistical leakage modeling for random dopant induced threshold voltage shift

  1. Gu, J.
  2. Sapatnekar, S.S.
  3. Kim, C.
Proceedings:
Proceedings - Design Automation Conference

ISSN: 0738-100X

ISBN: 9781595936271

Year of publication: 2007

Pages: 87-92

Type: Conference paper

DOI: 10.1109/DAC.2007.375130 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus