Width-dependent statistical leakage modeling for random dopant induced threshold voltage shift
- Gu, J.
- Sapatnekar, S.S.
- Kim, C.
ISSN: 0738-100X
ISBN: 9781595936271
Année de publication: 2007
Pages: 87-92
Type: Communication dans un congrès
Actes de conférence:
Proceedings - Design Automation Conference
