Impact of NBTI on SRAM read stability and design for reliability
- Kumar, S.V.
- Kim, C.H.
- Sapatnekar, S.S.
ISSN: 1948-3287, 1948-3295
ISBN: 9780769525235
Année de publication: 2006
Pages: 210-218
Type: Communication dans un congrès
Actes de conférence:
Proceedings - International Symposium on Quality Electronic Design, ISQED
