An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors

  1. Rigamonti, M.
  2. Baraldi, P.
  3. Alessi, A.
  4. Zio, E.
  5. Astigarraga, D.
  6. Galarza, A.
Aldizkaria:
IEEE Transactions on Reliability

ISSN: 0018-9529

Argitalpen urtea: 2018

Alea: 67

Zenbakia: 3

Orrialdeak: 1304-1313

Mota: Artikulua

DOI: 10.1109/TR.2018.2834828 GOOGLE SCHOLAR

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