An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors

  1. Rigamonti, M.
  2. Baraldi, P.
  3. Alessi, A.
  4. Zio, E.
  5. Astigarraga, D.
  6. Galarza, A.
Revue:
IEEE Transactions on Reliability

ISSN: 0018-9529

Année de publication: 2018

Volumen: 67

Número: 3

Pages: 1304-1313

Type: Article

DOI: 10.1109/TR.2018.2834828 GOOGLE SCHOLAR

Objectifs de Développement Durable