Tradeoffs between gate oxide leakage and delay for dual <i>T<sub>ox</sub></i> circuits
- Sultania, AK
- Sylvester, D
- Sapatnekar, SS
ISSN: 0738-100X
ISBN: 1-58113-828-8
Datum der Publikation: 2004
Seiten: 761-766
Kongress: 41st Design Automation Conference
Art: Konferenz-Beitrag